Conditioning and qualifying a microwave - BIT (Built in test) unit for use in the Tarang system [End User - IAF]
IR@NAL: CSIR-National Aerospace Laboratories, Bangalore
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Title |
Conditioning and qualifying a microwave - BIT (Built in test) unit for use in the Tarang system [End User - IAF]
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Creator |
Srihari, Shylaja
Revathi, A Murugan, M. Sendil Rao, RMVGK |
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Subject |
Aeronautics (General)
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Description |
The Microwave component -BIT (Built In Test) unit was subjected to CATH test in a Combined Altitude, Temperature and Humidity chamber. This unit was developed by M/s FLIC Microwaves Pvt Ltd, Hyderabad for BEL, Bangalore for
use in Tarang Systems. The CATH test was done as per MIL-STD 810F, Method 500.4 for acceptance by end user. While conditioning, the functional test (Perform Frequency generation and Power Output measurements) was carried out by the firm and the unit was handed over to the firm.
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Publisher |
National Aerospace Laboratories
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Date |
2006-11
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Type |
Proj.Doc/Technical Report
NonPeerReviewed |
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Format |
application/pdf
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Identifier |
http://nal-ir.nal.res.in/10094/1/PD_RP_0702.pdf
Srihari, Shylaja and Revathi, A and Murugan, M. Sendil and Rao, RMVGK (2006) Conditioning and qualifying a microwave - BIT (Built in test) unit for use in the Tarang system [End User - IAF]. Technical Report. National Aerospace Laboratories, Bangalore, India. |
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Relation |
http://nal-ir.nal.res.in/10094/
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