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Conditioning and qualifying a microwave - BIT (Built in test) unit for use in the Tarang system [End User - IAF]

IR@NAL: CSIR-National Aerospace Laboratories, Bangalore

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Title Conditioning and qualifying a microwave - BIT (Built in test) unit for use in the Tarang system [End User - IAF]
 
Creator Srihari, Shylaja
Revathi, A
Murugan, M. Sendil
Rao, RMVGK
 
Subject Aeronautics (General)
 
Description The Microwave component -BIT (Built In Test) unit was subjected to CATH test in a Combined Altitude, Temperature and Humidity chamber. This unit was developed by M/s FLIC Microwaves Pvt Ltd, Hyderabad for BEL, Bangalore for use in Tarang Systems. The CATH test was done as per MIL-STD 810F, Method 500.4 for acceptance by end user. While conditioning, the functional test (Perform Frequency generation and Power Output measurements) was carried out by the firm and the unit was handed over to the firm.
 
Publisher National Aerospace Laboratories
 
Date 2006-11
 
Type Proj.Doc/Technical Report
NonPeerReviewed
 
Format application/pdf
 
Identifier http://nal-ir.nal.res.in/10094/1/PD_RP_0702.pdf
Srihari, Shylaja and Revathi, A and Murugan, M. Sendil and Rao, RMVGK (2006) Conditioning and qualifying a microwave - BIT (Built in test) unit for use in the Tarang system [End User - IAF]. Technical Report. National Aerospace Laboratories, Bangalore, India.
 
Relation http://nal-ir.nal.res.in/10094/