Effect of Mn doping on the structural, morphological, optical and magnetic properties of indium tin oxide films
IR@CGCRI: CSIR-Central Glass and Ceramic Research Institute, Kolkata
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Title |
Effect of Mn doping on the structural, morphological, optical and magnetic properties of indium tin oxide films
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Creator |
Reddy, K M
Hays, J Kundu, S Dua, L K Biswas, Prasanta Kumar Wang, C Shutthanandan, V Engelhard, M H Mathew, X Punnoose, A |
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Subject |
Engineering Materials
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Description |
We report on the preparation and characterization of high purity manganese (3-9 wt.%) doped indium tin oxide (ITO, In:Sn = 90:10) films deposited by sol-gel mediated dip coating. X-ray diffraction and selected area electron diffraction showed high phase purity cubic In2O3 and indicated a contraction of the lattice with Mn doping. High-resolution transmission electron microscopy depicted a uniform distribution of similar to 20 nm sized independent particles and particle induced x-ray emission studies confirmed the actual Mn ion concentration. UV-Vis diffuse reflectance measurements showed band gap energy of 3.75 eV and a high degree of optical transparency (90%) in the 100-500 nm thick ITO films. X-ray photoelectron spectroscopy core level binding energies for In 3d(5/2) (443.6 eV), Sn 3d(5/2) (485.6 eV) and Mn 2p(3/2) (640.2 eV) indicated the In3+, Sn4+ and Mn2+ oxidation states. Magnetic hysteresis loops recorded at 300 K yield a coercivity H-c similar to 80 Oe and saturation magnetization M-s similar to 0.39 mu(B)/Mn2+ ion. High-temperature magnetometry showed a Curie temperature T-c > 600 K for the 3.2% Mn doped ITO film.
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Publisher |
Springer
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Date |
2007-12
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Type |
Article
PeerReviewed |
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Format |
application/pdf
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Identifier |
http://cgcri.csircentral.net/581/1/biswaspk%2D2007.pdf
Reddy, K M and Hays, J and Kundu, S and Dua, L K and Biswas, Prasanta Kumar and Wang, C and Shutthanandan, V and Engelhard, M H and Mathew, X and Punnoose, A (2007) Effect of Mn doping on the structural, morphological, optical and magnetic properties of indium tin oxide films. Journal of Materials Science-Materials in Electronics, 18 (12). pp. 1197-1201. ISSN 0957-4522 |
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Relation |
http://cgcri.csircentral.net/581/
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