Error minimization in the envelope method for the determination of optical constants of a thin film
IR@NPL: CSIR-National Physical Laboratory, New Delhi
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| Title |
Error minimization in the envelope method for the determination of optical constants of a thin film
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| Creator |
Kar, Meenakshi
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| Subject |
Chemistry
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| Description |
The algorithm for the determination of optical constants of a weakly absorbing thin film from the envelope method has been modified to minimize the error in the estimated values of extinction coefficient (k) as a function of wavelength. The refinement procedure is based on an extension of interference order adjustment method used for improving the estimated values of film thickness d and wavelength-dependent refractive index n from the envelope method. The proposed modification when applied to a hypothetical as well as an experimental film is found to work well over a wide spectral region. Copyright © 2010 John Wiley & Sons, Ltd.
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| Publisher |
John Wiley and Sons
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| Date |
2009-12-16
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| Type |
Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://npl.csircentral.net/139/1/113.pdf
Kar, Meenakshi (2009) Error minimization in the envelope method for the determination of optical constants of a thin film. Surface and Interface Analysis, 42 (3). pp. 145-150. ISSN 1096-9918 |
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| Relation |
http://onlinelibrary.wiley.com/doi/10.1002/sia.3188/pdf
http://npl.csircentral.net/139/ |
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