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Os(VIII) doping effects on the properties and crystalline perfection of potassium hydrogen phthalate (KHP) crystals

IR@NPL: CSIR-National Physical Laboratory, New Delhi

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Title Os(VIII) doping effects on the properties and crystalline perfection of potassium hydrogen phthalate (KHP) crystals
 
Creator Muthu, K.
Bhagavannarayana, G.
Chandrasekaran, C.
Parthiban, S.
Meenakshisundaram, S. P.
Mojumdar, S. C.
 
Subject Chemistry
 
Description The effect of dopant, Os(VIII) on the growth process, crystalline perfection and properties of potassium hydrogen phthalate (KHP) single crystals grown by a slow evaporation solution growth technique has been investigated. The XRD analysis of black-colored doped specimen reveals slight structural changes as a result of doping. The SEM images exhibit defect centers and crystal voids. The complex formation of KHP with Os(VIII) is evidenced by the considerable shift in kmax of the doped specimen and enhanced fluorescence intensity is observed by doping. Differential scanning calorimetry (DSC) and TG-DTA studies reveal the purity of the sample and no decomposition is observed up to the melting point. The high resolution X-ray diffraction (HRXRD) studies used to evaluate the crystalline perfection reveal some features on the capability of accommodating the dopant in the crystalline matrix. The diffraction curve (DC) patterns indicate that the high valence transition metal predominantly occupies the interstitial positions and the doping depresses the second harmonic generation (SHG) efficiency owing to the deterioration of crystalline perfection disturbing the charge transfer and nonlinearity.
 
Publisher Springer Verlag
 
Date 2010
 
Type Article
PeerReviewed
 
Format application/pdf
 
Identifier http://npl.csircentral.net/273/1/238.pdf
Muthu, K. and Bhagavannarayana, G. and Chandrasekaran, C. and Parthiban, S. and Meenakshisundaram, S. P. and Mojumdar, S. C. (2010) Os(VIII) doping effects on the properties and crystalline perfection of potassium hydrogen phthalate (KHP) crystals. Journal of Thermal Analysis and Calorimetry , 100 (3). pp. 793-799. ISSN 1572-8943
 
Relation http://www.springerlink.com/content/qx32r63h9w220012/
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