SEM studies on silica from plain materials, X-ray spectometro.
IR@AMPRI: CSIR-Advanced Materials and Processes Research Institute, Bhopal
View Archive Info| Field | Value | |
| Title |
SEM studies on silica from plain materials, X-ray spectometro.
|
|
| Creator |
P, Prasann
M., Patel |
|
| Subject |
Lightweight Materials
|
|
| Description |
The Silica structural framework in plant materials can be separated from the organic part by acid leaching and can be examined by SEM. Scanning electron micrographs characterizing the bonding and distribution patterns of silica in rice husk, rice straw and sugarcane leaves are presented. The differences in the surface morphology of the three plant products are discussed.
|
|
| Date |
1987
|
|
| Type |
Article
PeerReviewed |
|
| Identifier |
P, Prasann and M., Patel (1987) SEM studies on silica from plain materials, X-ray spectometro. X-Ray Spectrometry. pp. 57-60.
|
|
| Relation |
http://ampri.csircentral.net/334/
|
|