Strength of polycrystalline niobium from high-pressure x-ray diffraction data: A comparison of results from line-width and line-shift analyses
IR@NAL: CSIR-National Aerospace Laboratories, Bangalore
View Archive Info| Field | Value | |
| Title |
Strength of polycrystalline niobium from high-pressure x-ray diffraction data: A comparison of results from line-width and line-shift analyses
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| Creator |
Singh, AK
Liermann, HP |
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| Subject |
Chemistry and Materials (General)
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| Description |
High purity polycrystalline niobium was compressed in a diamond anvil cell (DAC) without any pressure transmitting medium and the pressure was increased in steps of �5 GPa to the highest pressure of �40 GPa. The diffraction pattern was recorded after each pressure increment using
angle-dispersive mode with the conventional diffraction geometry, wherein the primary x-ray beam is parallel to the load axis of the DAC. The strength of niobium as function of pressure was determined using the line-width and line-shift analyses. Both eY and 2eY, where Y is the aggregate Young’s modulus and e is the strain determined from the line-width analysis, have been used as the measure of strength in earlier studies. In this study, it is eY that agrees with the strength determined from the line-shift analysis of the radial diffraction data as well as the data from the conventional diffraction geometry. These results have been discussed and compared with a similar observation made earlier on strength of diamond. This study highlights the ambiguity that presently exists in
choosing eY or 2eY as a measure of strength while attempting to estimate the strength from the diffraction
line width analysis.
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| Publisher |
American Institute of Physics
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| Date |
2015-07
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| Type |
Journal Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://nal-ir.nal.res.in/12304/1/JAP%2D2015.pdf
Singh, AK and Liermann, HP (2015) Strength of polycrystalline niobium from high-pressure x-ray diffraction data: A comparison of results from line-width and line-shift analyses. Journal of Applied Physics, 118 . 065903-1-065903-5. ISSN 0021-8979 |
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| Relation |
http://dx.doi.org/10.1063/1.4927727
http://nal-ir.nal.res.in/12304/ |
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