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Study of growth of dot and column in porous silicon samples of various thicknesses prepared at a constant current density

IR@NPL: CSIR-National Physical Laboratory, New Delhi

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Title Study of growth of dot and column in porous silicon samples of various thicknesses prepared at a constant current density
 
Creator Singh Gill, Fateh
Panwar, Varij
Gupta, Himanshu
Kalra, G. S.
Chawla, Shanta
Kumar, R.
Mehra, R. M.
 
Subject Applied Physics/Condensed Matter
Nanoscience/ Nanotechnology
 
Description Porous silicon is considered to be composed either of spherical shaped interconnected silicon quantum dots or combination of quantum clots and columns. This paper presents a study of a series of porous silicon films of various thicknesses, prepared at a 20 mA current density by the electrochemical etching technique. The photoluminescence spectra of the series samples were monitored. Further, we used a photoluminescence fitting model by Singh and John (John-Singh) in its extended form by Elhouichet to estimate the percentage of dots and columns; their average diameters and corresponding variances. The shape of experimental photoluminescence spectra fits well with John-Singh model. As a result, the analytical curves drawn using the fitting parameters showed the decrease in mean crystallite diameter of columns and dot while increase in variance of column and decrease in variance of dots. Hence, more homogenous dots are formed. Thus, it results in the formation of a more ordered nanocrystalline structure with more porosity. It verified the quantum assumptions. The discrepancy in the PL behavior of a sample is well explained by the model.
 
Publisher Elsevier
 
Date 2015-09
 
Type Article
PeerReviewed
 
Format application/pdf
 
Identifier http://npl.csircentral.net/2013/1/320.pdf
Singh Gill, Fateh and Panwar, Varij and Gupta, Himanshu and Kalra, G. S. and Chawla, Shanta and Kumar, R. and Mehra, R. M. (2015) Study of growth of dot and column in porous silicon samples of various thicknesses prepared at a constant current density. Physica E: Low-dimensional Systems and Nanostructures, 73. pp. 110-115. ISSN 1386-9477
 
Relation http://npl.csircentral.net/2013/