X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films
IR@NPL: CSIR-National Physical Laboratory, New Delhi
View Archive Info| Field | Value | |
| Title |
X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films
|
|
| Creator |
Kumar, Amit
Singh, F. -, Govind Shivaprasad, S. M. Avasthi, D. K. Pivin, J. C. |
|
| Subject |
Chemistry
Applied Chemistry Materials Science Physics |
|
| Description |
The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopy are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp(2) to sp(3) conversion) and reduction of pi electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence.
|
|
| Publisher |
Elsevier
|
|
| Date |
2008
|
|
| Type |
Article
PeerReviewed |
|
| Format |
application/pdf
|
|
| Identifier |
http://npl.csircentral.net/2089/1/292.pdf
Kumar, Amit and Singh, F. and -, Govind and Shivaprasad, S. M. and Avasthi, D. K. and Pivin, J. C. (2008) X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C-60 films. Applied Surface Science, 254 (22). pp. 7280-7284. ISSN 0169-4332 |
|
| Relation |
http://npl.csircentral.net/2089/
|
|