Structural and microhardness studies of pure and thiourea doped glycine phosphite single crystal
IR@NPL: CSIR-National Physical Laboratory, New Delhi
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| Title |
Structural and microhardness studies of pure and thiourea doped glycine phosphite single crystal
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| Creator |
Vizhi, R. Ezhil
Kalainathan, S. G. , Baghavan Narayana |
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| Subject |
Crystallography
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| Description |
Ferroelectric Glycine Phosphite (GPI) crystal have been grown from aqueous solution employing the slow cooling technique. As the crystal solubility in water depends on temperature, single crystals were grown. Transparent, colourless crystals with habit morphology weighing about 8g were obtained with in a month. The same procedure was used to grow single crystals of 10 wt% of Thiourea doped GPI (TUGPI). Formation of a new crystal was confirmed by Powder X-ray diffraction studies as well as FTIR studies. Crystalline quality were found using rocking curve for both the crystals. Due to the presence of Thiourea in TUGPI, it improves the crystalline perfection and also enhances the growth rate. The variation of hardness on (010) faces of monoclinic GPI and TUGPI crystals, with load were studied Vickers hardness numbers, H-v were found to decrease with the increase in load. The value of Mayer's index 'n' was found to be greater than 1.6 for GPI and TUGPI showing soft-material category. The results are discussed in detail.
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| Publisher |
Wiley-VCH Verlag Berlin
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| Date |
2008
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| Type |
Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://npl.csircentral.net/2108/1/236.pdf
Vizhi, R. Ezhil and Kalainathan, S. and G. , Baghavan Narayana (2008) Structural and microhardness studies of pure and thiourea doped glycine phosphite single crystal. Crystal Research and Technology , 43 (7). 778-782 . ISSN 1521-4079 |
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| Relation |
http://npl.csircentral.net/2108/
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