Effect of Al doping on structural and dielectric properties of PLZT ceramics
IR@NPL: CSIR-National Physical Laboratory, New Delhi
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Title |
Effect of Al doping on structural and dielectric properties of PLZT ceramics
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Creator |
Rai, R.
Sharma, S. Choudhary, R. N. P. |
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Subject |
Agriculture, Multidisciplinary
Materials Science |
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Description |
yPolycrystalline samples of Al modified lead lanthanum zirconate titanate [PLZT] with Zr = 55% and Ti = 45%, have been synthesized by a high-temperature solid-state reaction technique. X-ray diffraction analysis of the compounds suggests the formation of a single-phase compound with tetragonal structure. Dielectric studies of the compounds as a function of temperature (from 30 to 350 degrees C) at frequency (1, 10 and 100 kHz) show that the compounds undergo a phase transition of diffuse type. The transition temperature shifts towards higher side with increase in frequency a typical characteristic of a relaxor material. Diffusivity (gamma) study of phase transition of these compounds provided its value between 1 and 2, indicating the variation of degree of disordering in the system. Measurement of dc resistivity (rho) as a function of temperature (Room temperature, RT to 350 degrees C) at a constant biasing field suggests the compounds have negative temperature coefficient of resistance (NTCR).
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Publisher |
Springer Verlag
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Date |
2006-07
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Type |
Article
PeerReviewed |
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Format |
application/pdf
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Identifier |
http://npl.csircentral.net/2451/1/38.pdf
Rai, R. and Sharma, S. and Choudhary, R. N. P. (2006) Effect of Al doping on structural and dielectric properties of PLZT ceramics. Journal of Materials Science , 41 (13). pp. 4259-4265. ISSN 0022-2461 |
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Relation |
http://npl.csircentral.net/2451/
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