Dielectric relaxation and hydrogen bonding interaction of solvents using time domain reflectometry technique from 10 MHz to 50 GHz
IR@NISCAIR: CSIR-NISCAIR, New Delhi - ONLINE PERIODICALS REPOSITORY (NOPR)
View Archive Info| Field | Value | |
| Title |
Dielectric relaxation and hydrogen bonding interaction of solvents using time domain reflectometry technique from 10 MHz to 50 GHz
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| Creator |
Deshmukh, A R
Shinde, R V Ingole, S A Pathan, A W Lokhande, M P Sarode, A V Kumbharkhane, A C |
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| Subject |
Time domain reflectometry
Dielectric permittivity Dielectric loss Havriliak-Negami equation |
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| Description |
346-352
Complex permittivity spectra ε*(ν) of nine different solvents have been studied in order to extract information at molecular level. The study covers highly polar organic compounds like water having high polarity index (PI=9.0) to chlorobenzene with low polarity index (PI=0.2) and also for the binary mixture of acetonitril (ACN)-dioxane (Dx) and acrylonitrile (ACRN) –dioxane (Dx). Time domain reflectometry (TDR) has been employed in the frequency region of 10 MHz to 50 GHz at room temperature to obtain various parameters such as complex permittivity ε*(w), dielectric constant ε<sub>0, </sub> high frequency limiting dielectric constant (ε<sub>∞</sub>), relaxation amplitude (∆ε) and relaxation time (τ). The values of dielectric parameters obtained have been compared with the literature values. Havriliak-Negami equation has been used to analyze the complex permittivity spectra. The Luzar theory and Kirkwood correlation factor are also applied to extract other dielectric parameters. |
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| Date |
2018-04-16T09:01:12Z
2018-04-16T09:01:12Z 2018-04 |
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| Type |
Article
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| Identifier |
0975-0959 (Online); 0301-1208 (Print)
http://nopr.niscair.res.in/handle/123456789/44193 |
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| Language |
en_US
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| Rights |
<img src='http://nopr.niscair.res.in/image/cc-license-sml.png'> <a href='http://creativecommons.org/licenses/by-nc-nd/2.5/in' target='_blank'>CC Attribution-Noncommercial-No Derivative Works 2.5 India</a>
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| Publisher |
NISCAIR-CSIR, India
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| Source |
IJPAP Vol.56(04) [April 2018]
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