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Study of injection and transport properties of metal/organic interface using HAT-CN molecules as hole injection layer

IR@NPL: CSIR-National Physical Laboratory, New Delhi

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Title Study of injection and transport properties of metal/organic interface using HAT-CN molecules as hole injection layer
 
Creator Rajan, Gopeeka
Yadav, Vandana
Manzhi, Payal
Chauhan, Gayatri
Suman, C. K.
Srivastava, Ritu
Sinha, O. P.
 
Subject Materials Science
Applied Physics/Condensed Matter
 
Description 1,4,5,8,9,11-hexaazatriphenylene-hexacarbonitrile (HAT-CN) molecule have been studied as hole injection layer for application in organic semiconductor based devices with potential to modify the electronic properties of electrodes due to its strong electron-withdrawing property. Thermally stable hole transport material 2, 7-bis [N, N-bis (4-methoxy-phenyl) amino] -9, 9-spirobifluorene (MeO-Spiro-TPD) has been used to fabricate hole only devices. To make the injection efficient at metal/organic interface and to reduce the driving voltage of the organic devices, the interface has been modified with a thin layer of highly electron accepting HAT-CN material. Modified interface has been investigated at a different range of thicknesses of HAT-CN. This interface modification resulted in the switching of injection limited transport to space charge limited conduction mechanism with the introduction of HAT-CN layer at metal/organic interfaces. The hole injection property has been found to increase with an increase in HAT-CN thickness. When these modified substrates were used as a hole injecting contacts in organic light emitting diodes (OLEDs), they have shown an increase in current density and device efficiency.
 
Publisher Elsevier
 
Date 2017-12
 
Type Article
PeerReviewed
 
Format application/pdf
 
Identifier http://npl.csircentral.net/2887/1/Study%20of%20injection%20and%20transport.pdf
Rajan, Gopeeka and Yadav, Vandana and Manzhi, Payal and Chauhan, Gayatri and Suman, C. K. and Srivastava, Ritu and Sinha, O. P. (2017) Study of injection and transport properties of metal/organic interface using HAT-CN molecules as hole injection layer. Vacuum, 146. pp. 530-536. ISSN 0042-207X
 
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