SIM Key Comparison of S-parameters SIM.EM.RF-K5b.CL
IR@NPL: CSIR-National Physical Laboratory, New Delhi
View Archive Info| Field | Value | |
| Title |
SIM Key Comparison of S-parameters SIM.EM.RF-K5b.CL
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| Creator |
Silva, H.
Monasterios, G Padilla, S. Ginley, R. Michaud, A. Negi, P. S. |
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| Subject |
Electronics and Electrical Engineering
Instruments/ Instrumentation |
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| Description |
The first RF key comparison within the Inter-American Metrology System (SIM) Regional Metrology Organization has been carried out. The purpose of it was to establish the degree of equivalence of scattering parameters measurements of both 1-port and 2-port coaxial devices among national metrology institutes (NMIs) that belong to SIM region and in support of CIPM Mutual Recognition Agreement (MRA). The travelling standards were four devices with Type-N coaxial connectors and 50 Omega of characteristic impedance: a matched load, a mismatched load and two attenuators of 3 dB and 20 dB. Four SIM institutes participated in the comparison as well as NPLI.
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| Date |
2018-07
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| Type |
Conference or Workshop Item
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://npl.csircentral.net/4046/1/doubt%20SIM%20Key%20Comparison%20of%20S-parameters.pdf
Silva, H. and Monasterios, G and Padilla, S. and Ginley, R. and Michaud, A. and Negi, P. S. (2018) SIM Key Comparison of S-parameters SIM.EM.RF-K5b.CL. In: 2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS, JUL 08-13, 2018, Paris, FRANCE. |
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| Relation |
http://npl.csircentral.net/4046/
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