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Dependence of Al incorporation on growth temperature during laser molecular beam epitaxy of AlxGa1-xN epitaxial layers on sapphire (0001)

IR@NPL: CSIR-National Physical Laboratory, New Delhi

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Title Dependence of Al incorporation on growth temperature during laser molecular beam epitaxy of AlxGa1-xN epitaxial layers on sapphire (0001)
 
Creator Tyagi, Prashant
Ch., Ramesh
Kushvaha, S. S.
Mishra, Monu
Gupta, Govind
Yadav, B. S.
Kumar, M. Senthil
 
Subject Materials Science
Metallurgy & Metallurgical Engineering
Physical Chemistry/Chemical Physics
 
Description We report the successful growth of AlxGa1-xN (0 <= x <= 0.25) epitaxial films on c-plane sapphire substrate by using laser molecular beam epitaxy technique. The role of growth temperature on the Al incorporation and the structural, electronic and optical properties of the AlxGa1-xN epitaxial layers grown in the temperature range 500-700 degrees C have been systematically studied. The atomic force microscopy analysis shows that the grain size of AlxGa1-xN increases with increase in growth temperature and flat surface epilayers are obtained at >= 600 degrees C. The Al incorporation is confirmed with high resolution x-ray diffraction, x-ray photo electron microscopy and photoluminescence studies. It is observed that the growth temperature plays a critical role in determining the Al composition, which increases with increasing growth temperature. AlxGa1-xN layer with about 23% of Al composition is obtained on sapphire (0001) substrate at a growth temperature of 700 degrees C, which is about 100-150 degrees C lower than the conventional molecular beam epitaxy growth.
 
Publisher Elsevier
 
Date 2018-03-30
 
Type Article
PeerReviewed
 
Format application/pdf
 
Identifier http://npl.csircentral.net/3881/1/Dependence%20of%20Al%20incorporation.pdf
Tyagi, Prashant and Ch., Ramesh and Kushvaha, S. S. and Mishra, Monu and Gupta, Govind and Yadav, B. S. and Kumar, M. Senthil (2018) Dependence of Al incorporation on growth temperature during laser molecular beam epitaxy of AlxGa1-xN epitaxial layers on sapphire (0001). Journal of Alloys and Compounds, 739. pp. 122-128. ISSN 0925-8388
 
Relation http://npl.csircentral.net/3881/