CSIR Central

A 10 V programmable Josephson voltage standard and its applications for voltage metrology

IR@NPL: CSIR-National Physical Laboratory, New Delhi

View Archive Info
 
 
Field Value
 
Title A 10 V programmable Josephson voltage standard and its applications for voltage metrology
 
Creator Tang, Y.
Ojha, V. N.
Schlamminger, S.
Ruefenacht, A.
Burroughs, C. J.
Dresselhaus, P. D.
Benz, S. P.
 
Subject Instruments/ Instrumentation
Applied Physics/Condensed Matter
 
Description The concept of a programmable Josephson voltage standard (PJVS) was first proposed in 1997. Since then a significant amount of research and development work has been devoted to the fabrication of the programmable Josephson junction array and its deployment in a voltage standard system. This paper reports the recent development of a 10 V PJVS system at the National Institute of Standards and Technology (NIST) and its voltage metrology applications. The superior stability of the voltage step of the new 10 V PJVS enables it to perform the same tasks as the conventional Josephson voltage standard (JVS) that uses hysteretic voltage steps and to improve the efficiency and effectiveness of a JVS direct comparison. For the first time, a comparison between a conventional JVS and the NIST 10 V PJVS was performed in order to verify the performance of the NIST 10 V PJVS. The mean difference between the two systems at 10 V was found to be -0.49 nV with a combined standard uncertainty of 1.32 nV (k = 1) or a relative combined standard uncertainty of 1.32 parts in 10(10). Automatic comparisons between the 10 V PJVS and a 2.5 V PJVS at 1.018 V were performed to monitor the long term accuracy and stability of the 2.5 V PJVS and to support the NIST electronic kilogram experiment. By matching the voltages of the two PJVS systems during a comparison, the type B uncertainty can be minimized to a negligible level. The difference between the two PJVS at 1.018 V was found to be -0.38 nV with a combined standard uncertainty of 0.68 nV (k = 1) or a relative combined standard uncertainty of 6.7 parts in 10(10). Issues encountered during the PJVS comparison and potential challenges for 10 V applications are also discussed.
 
Publisher IOP Publishing
 
Date 2012-12
 
Type Article
PeerReviewed
 
Format application/pdf
 
Identifier http://npl.csircentral.net/3704/1/A%2010%20V%20programmable%20Josephson%20voltage%20standard.pdf
Tang, Y. and Ojha, V. N. and Schlamminger, S. and Ruefenacht, A. and Burroughs, C. J. and Dresselhaus, P. D. and Benz, S. P. (2012) A 10 V programmable Josephson voltage standard and its applications for voltage metrology. Metrologia, 49 (6). pp. 635-643. ISSN 0026-1394
 
Relation http://npl.csircentral.net/3704/