Electronic reconstruction and enhanced superconductivity at La1.6-xNd0.4SrxCuO4/La1.55Sr0.45CuO4 bilayer interface
IR@NPL: CSIR-National Physical Laboratory, New Delhi
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| Title |
Electronic reconstruction and enhanced superconductivity at La1.6-xNd0.4SrxCuO4/La1.55Sr0.45CuO4 bilayer interface
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| Creator |
Rout, P. K.
Joshi, P. C. Porwal, Rajni Budhani, R. C. |
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| Subject |
Physics
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| Description |
We report enhanced superconductivity in bilayer thin films consisting of superconducting La1.6-xNd0.4SrxCuO4 with 0.06 <= x < 0.20 and metallic but non-superconducting La1.55Sr0.45CuO4. These bilayers show a maximum increase in superconducting transition temperature (T-c) of more than 200% for x = 0.06, while no change in T-c is observed for the bilayers with x >= 0.20. The analysis of the critical current and kinetic inductance data suggests 2-3 unit cells thick interfacial layer electronically perturbed to have a higher T-c. A simple charge transfer model with cation intermixing explains the observed T-c in bilayers. Still the unusually large thickness of interfacial superconducting layers cannot be explained in terms of this model. We believe that the stripe relaxation as well as the proximity effect also influence the superconductivity of the interface.
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| Publisher |
Institute of Physics
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| Date |
2012-06
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| Type |
Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://npl.csircentral.net/3597/1/Electronic%20reconstruction%20and%20enhanced.pdf
Rout, P. K. and Joshi, P. C. and Porwal, Rajni and Budhani, R. C. (2012) Electronic reconstruction and enhanced superconductivity at La1.6-xNd0.4SrxCuO4/La1.55Sr0.45CuO4 bilayer interface. EPL (Europhysics Letters), 98 (6). pp. 67007-67013. ISSN 0295-5075 |
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| Relation |
http://npl.csircentral.net/3597/
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