Evolution of SPR in 120MeV silver ion irradiated Cu (18%) C-60 nanocomposites thin films
IR@NPL: CSIR-National Physical Laboratory, New Delhi
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| Title |
Evolution of SPR in 120MeV silver ion irradiated Cu (18%) C-60 nanocomposites thin films
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| Creator |
Sharma, P.
Singhal, R. Vishnoi, R. Sharma, G. D. Kulriya, P. Ojha, S. Banerjee, M. K. Chand, S. |
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| Subject |
Electronics and Electrical Engineering
Materials Science Applied Physics/Condensed Matter |
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| Description |
Copper metal embedded fullerene C-60 thin films are deposited on various substrates via resistive heating co evaporation technique. Rutherford back scattering simulated spectrum confirms the thickness and composition of thin film to be 32nm and 18at%, respectively. The deposited thin films are irradiated by 120MeV Ag ion beam for different fluences within the range, from 1x10(12) to 3x10(13) ions/cm(2). UV-vis absorption spectroscopy study reveals the appearance of surface plasmon resonance (SPR) band in pristine thin film at 622nm; this phenomenon is ascribed to the presence of copper nanoparticles in C-60 matrix. The SPR band intensity increases with rising fluences, which is suggestive of the growth of Cu nanoparticles. Growth of Cu nanoparticles is further confirmed by transmission electron microscopic (TEM) and X-ray diffraction (XRD) study. Whereas the conversion of C-60 into amorphous carbon (a-C) is confirmed by Raman spectroscopy, XRD results of pristine Cu-C-60 thin film record the presence of Cu2O within the nanocomposite thin film. However, both X-ray photoelectron spectroscopy (XPS) and XRD studies on irradiated thin film samples authenticate the growth of Cu metal nanoparticles with concurrent removal of oxygen.
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| Publisher |
Springer Verlag
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| Date |
2019-05
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| Type |
Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://npl.csircentral.net/4194/1/Evolution%20of%20SPR%20in.pdf
Sharma, P. and Singhal, R. and Vishnoi, R. and Sharma, G. D. and Kulriya, P. and Ojha, S. and Banerjee, M. K. and Chand, S. (2019) Evolution of SPR in 120MeV silver ion irradiated Cu (18%) C-60 nanocomposites thin films. Journal of Materials Science: Materials in Electronics, 30 (9). pp. 8301-8311. ISSN 0957-4522 |
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| Relation |
http://npl.csircentral.net/4194/
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