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Cu(II) and Gd(III) doped boehmite nanostructures: a comparative study of electrical property and thermal stability

IR@CGCRI: CSIR-Central Glass and Ceramic Research Institute, Kolkata

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Title Cu(II) and Gd(III) doped boehmite nanostructures: a comparative study of electrical property and thermal stability
 
Creator Roy, Shubham
Bardhan, Souravi
Chanda, Dipak Kr
Maity, Anupam
Ghosh, Saheli
Mondal, Dhananjoy
Singh, Subhankar
Das, Sukhen
 
Subject Engineering Materials
 
Description The present article reports the effect of transition (Cu2+) and rare earth metal (Gd3+) ion doping on structural, microstructural and electrical properties of boehmite nanoparticles. Rietveld refinement is adopted here to refine the x-ray diffractograms for further analyzing the microstructural details and their alteration due to the incorporation of foreign cations. This is probably the first time when dielectric properties of these doped boehmite samples having been reported herein. These samples show remarkably high dielectric constant values which corroborate that doping enhances the microstrain values inside the orthorhombic structure and results in higher crystallographic defects. Enhancement in defect sites causes the augmentation of relative permittivity and ac conductivity. Temperature stability has also been enhanced significantly in our Cu-doped sample. The present study enables us to determine a relationship between crystalline deformation and electrical properties of nanomaterials which may be highly beneficial in fabricating cost-effective energy harvesting devices.
 
Publisher IOP Publishing
 
Date 2020-02
 
Type Article
PeerReviewed
 
Format application/pdf
 
Identifier http://cgcri.csircentral.net/4961/1/roy.pdf
Roy, Shubham and Bardhan, Souravi and Chanda, Dipak Kr and Maity, Anupam and Ghosh, Saheli and Mondal, Dhananjoy and Singh, Subhankar and Das, Sukhen (2020) Cu(II) and Gd(III) doped boehmite nanostructures: a comparative study of electrical property and thermal stability. Materials Research Express , 7 (2). Art No-025020. ISSN 2053-1591
 
Relation http://cgcri.csircentral.net/4961/