Ellipsoidal surface characterization for validating the UTD formulation
IR@NAL: CSIR-National Aerospace Laboratories, Bangalore
View Archive Info| Field | Value | |
| Title |
Ellipsoidal surface characterization for validating the UTD formulation
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| Creator |
Choudhury, R
Jha, RM |
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| Subject |
Aircraft Communication & Navigation
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| Description |
The UTD mutual coupling results are presented for ellipsoid of revolution for slots located arbitrarily on the surface. The rigorous 3-dimensional ray tracing has been performed by the Geodesic Constant Method. The ellipsoid of revolution, which an unequal double curvatured surfaces without any edges, provides an ideal surface for verifying the heuristics involved in the UTD (surface-diffracted) formulation.
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| Date |
1995
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| Type |
Journal Article
PeerReviewed |
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| Identifier |
Choudhury, R and Jha, RM (1995) Ellipsoidal surface characterization for validating the UTD formulation. IEEE Antennas and Propagation Society, AP-S International Symposium (Digest), 4 . pp. 1922-1925.
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| Relation |
http://nal-ir.nal.res.in/319/
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