Characteristics of sol–gel dip coated Ceria films
IR@CECRI: CSIR-Central Electrochemical Research Institute, Karaikudi
View Archive Info| Field | Value | |
| Title |
Characteristics of sol–gel dip coated Ceria films
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| Creator |
Murali, K.R.
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| Subject |
Electrochemical Materials Science
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| Description |
Cerium oxide(CeO2) thin films were deposited
by the sol–gel dip coating technique using cerium chloride,
acrylamide and N,N bis methylene acrylamide. The as
deposited films were heat-treated at different temperatures
in air. X-ray diffraction studies indicated the films to be of single phase CeO2. Optical bandgap in the range of 3.53–
3.60 eV was obtained from optical studies. Laser Raman
studies exhibited Raman bands around 457 cm�1.
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| Publisher |
Springer Science+Business Media
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| Date |
2008
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| Type |
Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://cecri.csircentral.net/343/1/100-2008.pdf
Murali, K.R. (2008) Characteristics of sol–gel dip coated Ceria films. Journal of Materials Science: Materials in Electronics, 19 (4). pp. 369-371. ISSN 0957-4522 |
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| Relation |
http://cecri.csircentral.net/343/
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