A dew point meter comprising a nanoporous thin film alumina humidity sensor with a linearizing capacitance measuring electronics
IR@CGCRI: CSIR-Central Glass and Ceramic Research Institute, Kolkata
View Archive Info| Field | Value | |
| Title |
A dew point meter comprising a nanoporous thin film alumina humidity sensor with a linearizing capacitance measuring electronics
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| Creator |
Ghara, Dilip Kumar
Saha, Debdulal Sengupta, Kamalendu |
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| Subject |
Electronics
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| Description |
A novel trace moisture analyzer is presented comprising a capacitive nanoporous film of metal oxide sensor and electronics. The change in capacity of the sensor is due to absorption of water vapor by the pores. A simple capacitance measuring electronics is developed which can detect any change in capacitance and correlates to ambient humidity. The circuit can minimize the parasitic earth capacitance. The non linear response of the sensor is linearized with a micro-controller linearizing circuit. The experimental result shows a resolution of -4°C DP and accuracy within 2%.
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| Publisher |
IFSA
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| Date |
2008-02
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| Type |
Article
PeerReviewed |
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| Format |
application/pdf
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| Identifier |
http://cgcri.csircentral.net/1200/1/debdulal'08.pdf
Ghara, Dilip Kumar and Saha, Debdulal and Sengupta, Kamalendu (2008) A dew point meter comprising a nanoporous thin film alumina humidity sensor with a linearizing capacitance measuring electronics. Sensors & Transducers Journal, 88 (2). pp. 59-65. ISSN 1726- 5479 |
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| Relation |
http://www.sensorsportal.com
http://cgcri.csircentral.net/1200/ |
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